Lecture session C2L-A / 10:25am – 11:25am
Special Sessions: State-of-the-Art Solutions for IC Testing
Clic here for detailed information (including list of authors and abstrtact, clic on the paper number)
Clic on the title link below to view the video presentations of each papers:
(the links will be live starting June 12, 2020)
10:25am – 5097 Static Linearity BIST for Vcm-Based Switching SAR ADCs Using a Reduced-Code Measurement Technique
10:37am – 5171 Using Optimized Butterworth-Based ΣΔ Bitstreams for the Testing of High-Resolution Data Converters
10:49am – 5179 Accelerating STT-MRAM Ramp-Up Characterization
11:01am – 5174 On the Importance of Bias-Dependent Charge Injection for SET Evaluation in AMS Circuits
11:13am – 5042 A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit
